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Transducers and Probes

Transducers and Probes

Olympus NDT probes and transducers are high-quality inspection equipment available in a range of frequencies, configurations, connection styles, and cable types. All our probes and transducers are lightweight but solidly constructed. Olympus’ experience in designing and manufacturing NDT probes and transducers enables us to offer equipment that exceeds many global inspection requirements. We offer a range of transducers for flaw detection, thickness gauging, and material research. Additionally, Olympus offers design services and can provide custom probe solutions to meet application needs.

Ultrasonic and Eddy Current Probes

Ultrasonic Transducers

Ultrasonic Transducers

Ultrasonic transducers are used for applications as diverse as flaw detection, thickness gaging, materials research and medical diagnostics. More than 5000 ultrasonic transducer types come in many styles, element diameters, frequencies, and connector styles.

Eddy Current Probes

Eddy Current Probes

Eddy current probes consist of the acquired brands of Nortec and NDT Engineering. We offer more than 10,000 standard and custom designed eddy current probes, standard references, and accessories.

Probes for Tube Inspection

Probes for Tube Inspection

Probes for tube inspection are lightweight but solidly constructed eddy current, remote field, magnetic flux leakage, and IRIS ultrasound. These probes are used for ferromagnetic or non-ferromagnetic tube inspection applications.

Phased Array Probes

Phased Array Probes

Phased array application-specific probes have a range from 0.5 MHz to 18 MHz and may come with 16, 32, 64, or 128 elements. Special probes may have up to hundreds of elements.

BondMaster Probes

BondMaster Probes

BondMaster probes include a wide variety of versatile probes such as pitch-catch, MIA (mechanical impedance analysis), and resonance probes.

Eddy Current Array Probes

Eddy Current Array Probes

Eddy Current Array probes are for corrosion detection, friction stir weld inspection, and surface and sub-surface detection accelerate the inspection process.

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